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You searched for: Author/Creator Roy, D. Journal Microelectronics and reliabilityLimit your search
- Microelectronics and reliability [remove]3
- Roy, D. [remove] 3
- 621.3815 3
- Appareils électroniques -- Fiabilité -- Périodiques 3
- Electronic apparatus and appliances -- Reliability 3
- Electronic apparatus and appliances -- Reliability -- Periodicals 3
- Miniature electronic equipment 3
- Miniature electronic equipment -- Periodicals 3
- Periodicals 3
- Équipement électronique miniaturisé -- Périodiques 3
- FDSOI -- CMOS -- Fast measurement -- Temperature -- Recovery -- Stress -- Vgrecovery -- NBTI -- Compact model -- Reliability 1
- Reliability -- Cumulative distribution function -- Bias temperature instability -- Defect centric model 1