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1. Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf0.5Zr0.5O2 Capacitors. Issue 21 (6th September 2019)

5. A Silicon Nanowire Ferroelectric Field‐Effect Transistor. (4th March 2020)

9. Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy. Issue 47 (21st October 2022)