1. (Keynote) Low Temperature SmartCutTM Process for 3D Integration. (24th April 2020) Authors: Schwarzenbach, Walter; Reboh, Shay; Ghorbel, Aymen; Gaudin, Gweltaz; Besnard, Guillaume; Mazen, Frédéric; Loup, Virginie; Maitrejean, Sylvain; Brunet, Laurent; Nguyen, Bich-Yen; Maleville, Christophe Journal: ECS transactions Issue: Volume 97:Number 5(2020) Page Start: 129 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A New Method to Induce Tensile Stress in Silicon on Insulator Substrate: From Material Analysis to Device Demonstration. (31st March 2015) Authors: Maitrejean, Sylvain; Loubet, Nicolas; Augendre, Emmanuel; Morin, Pierre Francois; Reboh, Shay; Bernier, Nicolas; Wacquez, Romain; Lherron, Benoit; Bonnevialle, Aurore; Liu, Qing; Hartmann, Jean-Michel; He, Hong; Halimaoui, Aomar; Li, Juntao; Pilorget, Sonia; Kanyandekwe, Joel; Grenouillet, Lauren... Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 47 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Germanium Enrichment for Planar-, Fin- and Nanowire-Channel MOSFETs Made on SOI. (18th August 2016) Authors: Augendre, Emmanuel; Loubet, Nicolas; Morin, Pierre Francois; Liu, Qing; Schmitt, Joël; L'Herron, Benoît; Nguyen, Phuong; Barraud, Sylvain; Hutin, Louis; Maitrejean, Sylvain; De Salvo, Barbara; Coquand, Rémi; Reboh, Shay; Venigalla, Rajasekhar; Doris, Bruce; Yamashita, Tenko; Faynot, Olivier; Vine... Journal: ECS transactions Issue: Volume 75:Number 8(2016) Page Start: 505 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. In-situ X-ray μLaue diffraction study of copper through-silicon vias. (January 2016) Authors: Sanchez, Dario Ferreira; Reboh, Shay; Weleguela, Monica Larissa Djomeni; Micha, Jean-Sébastien; Robach, Odile; Mourier, Thierry; Gergaud, Patrice; Bleuet, Pierre Journal: Microelectronics and reliability Issue: Volume 56(2016) Page Start: 78 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. In-situ X-ray μLaue diffraction study of copper through-silicon vias. (January 2016) Authors: Sanchez, Dario Ferreira; Reboh, Shay; Weleguela, Monica Larissa Djomeni; Micha, Jean-Sébastien; Robach, Odile; Mourier, Thierry; Gergaud, Patrice; Bleuet, Pierre Journal: Microelectronics and reliability Issue: Volume 56(2016) Page Start: 78 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Stress effect on the orientation and the arrangement of H‐platelets. Issue 1 (29th November 2012) Authors: Vallet, Maxime; Reboh, Shay; Beaufort, Marie‐France; Grilhé, Jean; Barbot, Jean François Journal: Physica status solidi Issue: Volume 10:Issue 1(2013:Jan.) Page Start: 44 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Lattice strain distribution resolved by X‐ray Bragg‐surface diffraction in an Si matrix distorted by embedded FeSi2 nanoparticles. (10th November 2013) Authors: Lang, Rossano; de Menezes, Alan S.; dos Santos, Adenilson O.; Reboh, Shay; Meneses, Eliermes A.; Amaral, Livio; Cardoso, Lisandro P. Journal: Journal of applied crystallography Issue: Volume 46:Part 6(2013:Dec.) Page Start: 1796 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗