1. A low cost Sn doped ZnO thin film based Schottky diode for UV detection. (June 2022) Authors: Yadav, Aniruddh Bahadur; Rawat, Gopal; Sannakashappanavar, Basavaraj S. Journal: Materials today communications Issue: Volume 31(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analytical modeling and TCAD simulation for subthreshold characteristics of asymmetric Tunnel FET. (May 2022) Authors: Talukdar, Jagritee; Rawat, Gopal; Mummaneni, Kavicharan Journal: Materials science in semiconductor processing Issue: Volume 142(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electrical and optical characteristics of solution-processed MoOx and ZnO QDs heterojunction. (10th August 2017) Authors: Kumar, Hemant; Kumar, Yogesh; Rawat, Gopal; Kumar, Chandan; Mukherjee, Bratindranath; Pal, Bhola N.; Jit, Satyabrata Journal: MRS communications Issue: Volume 7:Number 3(2017) Page Start: 607 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Negative capacitance gate-all-around PZT silicon nanowire with high-K/metal gate MFIS structure for low SS and high Ion/Ioff. (1st May 2023) Authors: Kumar, Vivek; Maurya, Ravindra Kumar; Malvika, ; Rawat, Gopal; Mummaneni, Kavicharan Journal: Semiconductor science and technology Issue: Volume 38:Number 5(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Negative capacitance gate-all-around PZT silicon nanowire with high-K/metal gate MFIS structure for low SS and high Ion/Ioff. (1st May 2023) Authors: Kumar, Vivek; Maurya, Ravindra Kumar; Malvika, ; Rawat, Gopal; Mummaneni, Kavicharan Journal: Semiconductor science and technology Issue: Volume 38:Number 5(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Negative capacitance gate-all-around PZT silicon nanowire with high-K/metal gate MFIS structure for low SS and high Ion/Ioff. (1st May 2023) Authors: Kumar, Vivek; Maurya, Ravindra Kumar; Malvika, ; Rawat, Gopal; Mummaneni, Kavicharan Journal: Semiconductor science and technology Issue: Volume 38:Number 5(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Negative capacitance gate-all-around PZT silicon nanowire with high-K/metal gate MFIS structure for low SS and high Ion/Ioff. (1st May 2023) Authors: Kumar, Vivek; Maurya, Ravindra Kumar; Malvika, ; Rawat, Gopal; Mummaneni, Kavicharan Journal: Semiconductor science and technology Issue: Volume 38:Number 5(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Negative capacitance gate-all-around PZT silicon nanowire with high-K/metal gate MFIS structure for low SS and high Ion/Ioff. (1st May 2023) Authors: Kumar, Vivek; Maurya, Ravindra Kumar; Malvika, ; Rawat, Gopal; Mummaneni, Kavicharan Journal: Semiconductor science and technology Issue: Volume 38:Number 5(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Negative capacitance gate-all-around PZT silicon nanowire with high-K/metal gate MFIS structure for low SS and high Ion/Ioff. (1st May 2023) Authors: Kumar, Vivek; Maurya, Ravindra Kumar; Malvika, ; Rawat, Gopal; Mummaneni, Kavicharan Journal: Semiconductor science and technology Issue: Volume 38:Number 5(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Noise behavior and reliability analysis of non-uniform body tunnel FET with dual material source. (April 2022) Authors: Talukdar, Jagritee; Rawat, Gopal; Mummaneni, Kavicharan Journal: Microelectronics and reliability Issue: Volume 131(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗