1. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Chemical imaging of oxide confinement layers in GaAs/AlxGa1−xAs VCSELs. (1st July 2022) Authors: Mokhtari, Merwan; Pagnod-Rossiaux, Philippe; Levallois, Christophe; Pofelski, Alexandre; Laruelle, François; Botton, Gianluigi A; Landesman, Jean-Pierre Journal: Semiconductor science and technology Issue: Volume 37:Number 7(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Comparison Between Deep Learning and Iterative Bayesian Statistics Deconvolution Methods in Energy Electron Loss Spectroscopy. (August 2022) Authors: Mousavi M., S. Shayan; Pofelski, Alexandre; Botton, Gianluigi A. Journal: Microscopy and microanalysis Issue: Volume 28(2022)Supplement 1 Page Start: 3154 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Comparison Between Moiré Sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis Strain Characterization Method and Dark-Field Electron Holography. (August 2021) Authors: Pofelski, Alexandre; Whabi, Viraj; Ghanad-Tavakoli, Shahram; Botton, Gianluigi Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1982 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Crystal Lattices Reconstruction from Moiré Aliased Scanning Transmission Electron Microscopy Electron Micrograph. (August 2021) Authors: Pofelski, Alexandre; Botton, Gianluigi Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1986 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. EELSpecNet: Deep Convolutional Neural Network Solution for Electron Energy Loss Spectroscopy Deconvolution. (August 2021) Authors: Shayan Mousavi M, S.; Pofelski, Alexandre; Botton, Gianluigi Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 1626 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Mechanical Analyses of Extended and Localized UTBB Stressors Formed with Ge Enrichment Techniques. (31st March 2015) Authors: Morin, Pierre Francois; Grenouillet, Laurent; Loubet, Nicolas; Pofelski, Alexandre; Lu, Darsen; Liu, Qing; Augendre, Emmanuel; Maitrejean, Sylvain; Fiori, Vincent; de Salvo, Barbara; Doris, Bruce; Kleemeier, Walter Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 57 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Nanoscale Structural and Emission Properties within "Russian Doll"‐Type InGaN/AlGaN Quantum Wells. Issue 17 (1st June 2020) Authors: Cheng, Shaobo; Wu, Zewen; Langelier, Brian; Kong, Xianghua; Coenen, Toon; Hari, Sangeetha; Ra, Yong‐Ho; Rashid, Roksana Tonny; Pofelski, Alexandre; Yuan, Hui; Li, Xing; Mi, Zetian; Guo, Hong; Botton, Gianluigi A. Journal: Advanced optical materials Issue: Volume 8:Issue 17(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗