1. (Invited) Broadband Spectroscopic Characterization of Electrically Active Defects in Dielectrics: Monitoring the in-Service Evolution of Dialectics in Integrated System. (26th April 2016) Authors: Obeng, Yaw S.; Okoro, Chukwudi A; Amoah, Papa K.; You, Lin Journal: ECS transactions Issue: Volume 72:Number 2(2016) Page Start: 123 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Characterization of Buried Interfaces with Scanning Probe Microscopes. (26th April 2016) Authors: Kopanski, Joseph J.; You, Lin; Li, Jennifer; Ahn, Jung Joon; Obeng, Yaw S. Journal: ECS transactions Issue: Volume 72:Number 2(2016) Page Start: 131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Hardware Security to Mitigate Threats to Networked More-Than-Moore Sensors. (25th April 2016) Authors: Obeng, Yaw S. Journal: ECS transactions Issue: Volume 72:Number 3(2016) Page Start: 113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) Understanding the Pre-Failure Thermo-Mechanical Issues in Electromigration of TSV Enabled 3D ICs. (18th April 2017) Authors: Sunday, Christopher E; Veksler, Dmitry; Cheung, K. P.; Obeng, Yaw S. Journal: ECS transactions Issue: Volume 77:Number 2(2017) Page Start: 71 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (16th August 2017) Authors: Sunday, Christopher E; Montgomery, Karl R.; Amoah, Papa K.; Iwuoha, Emmanuel I; Obeng, Yaw S. Journal: ECS transactions Issue: Volume 80:Number 1(2017) Page Start: 253 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (1st January 2017) Authors: Sunday, Christopher E.; Montgomery, Karl R.; Amoah, Papa K.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 9(2017) Page Start: N155 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications. (29th August 2017) Authors: Sunday, Christopher E.; Montgomery, Karl R.; Amoah, Papa K.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 9(2017) Page Start: N155 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Broadband Microwave Signal Dissipation in Nanostructured Copper Oxide at Air‐film Interface. Issue 12 (21st September 2020) Authors: Amoah, Papa K.; Košiček, Martin; Perez, Jesus; Sunday, Christopher E.; Moreau, Stéphane; Cvelbar, Uroš; Obeng, Yaw S. Journal: Electroanalysis Issue: Volume 32:Issue 12(2020) Page Start: 2795 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Broadband Microwave-Based Metrology Platform Development: Demonstration of In-Situ Failure Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses. (1st January 2015) Authors: You, Lin; Okoro, Chukwudi A.; Ahn, Jung-Joon; Kopanski, Joseph; Franklin, Rhonda R.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 1(2015) Page Start: N3113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Broadband Microwave-Based Metrology Platform Development: Demonstration of In-Situ Failure Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses. (7th November 2014) Authors: You, Lin; Okoro, Chukwudi A.; Ahn, Jung-Joon; Kopanski, Joseph; Franklin, Rhonda R.; Obeng, Yaw S. Journal: ECS journal of solid state science and technology Issue: Volume 4:Number 1(2015) Page Start: N3113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗