Author/Creator: Nolhier, N. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Nolhier, N.

1. 20 GHz on-chip measurement of ESD waveform for system level analysis. Issue 11 (November 2015)

Authors:: Caignet, F.; Nolhier, N.; Bafleur, M.; Wang, A.; Mauran, N.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 11(2015)
Page Start:: 2276
Record Type:: Journal Article
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2. Impact of non-linear capacitances on transient waveforms during system level ESD stress. (September 2016)

Authors:: Escudié, F.; Caignet, F.; Nolhier, N.; Bafleur, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 88
Record Type:: Journal Article
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3. Impact of non-linear capacitances on transient waveforms during system level ESD stress. (September 2016)

Authors:: Escudié, F.; Caignet, F.; Nolhier, N.; Bafleur, M.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 88
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Prediction of LIN communication robustness against EFT events using dedicated failure models. (September 2017)

Authors:: Escudié, F.; Caignet, F.; Nolhier, N.; Bafleur, M.
Journal:: Microelectronics and reliability
Issue:: Volume 76/77(2017)
Page Start:: 685
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗