Prediction of LIN communication robustness against EFT events using dedicated failure models. (September 2017)

• Record Type: Journal Article
• Authors: Escudié, F.; Caignet, F.; Nolhier, N.; Bafleur, M.
• Is Part Of: Microelectronics and reliability. Volume 76/77(2017)
• Page Start: 685
• Page End: 691
• Publication Date: 2017-09
• Subjects: Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2017.07.032
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: During its life, an automotive application can encounter several perturbations such as fast transient of ESD discharges. In this paper, we propose a LIN transceiver behavior model to predict both hard and soft failures within a communication link. The proposed model, extracted from measurements, is implemented into simulation as a failure block. We will show that depending on the output state of the LIN, the data reading behavior could be different. Using such model, corrections at system level can be implemented to avoid failures. Highlights: Using TLP-TDR (Transmission Line Pulse-Time Domain Reflectometry) to extract a model of ESD (ElectroStatic Discharge) protection. Simulate a black box model of IC against EFT (Electrical Fast Transient). Study of LIN (Local Interconnect Network) communication behavior against EFT. Predict the LIN bus behavior against EFT by simulation.