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You searched for: Author/Creator Lin, Yun-Hsuan

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1. Abnormal hump in low temperature in SiGe devices with silicon capping insertion layer. (30th July 2021)

2. Abnormal trend in hot carrier degradation with fin profile in short channel FinFET devices at 14 nm node. (1st April 2022)

3. Antibiotic susceptibility profiles of ocular and nasal flora in patients undergoing cataract surgery in Taiwan: an observational and cross-sectional study. Issue 8 (18th August 2017)

8. Investigation of degradation behavior under negative bias temperature stress in Si/Si0.8Ge0.2 metal-oxide-semiconductor capacitors. (2nd September 2021)

9. Investigation of degradation mechanism after negative bias temperature stress in Si/SiGe channel metal–oxide–semiconductor capacitors induced by hydrogen diffusion. (10th December 2021)