1. Characterisation of worn WC tool using STEM‐EDS aided by principal component analysis. (4th May 2021) Authors: Lazar, Isac; Lindvall, Rebecka; Lenrick, Filip; Bushlya, Volodymyr; Ek, Martin Journal: Journal of microscopy Issue: Volume 283:Part 1(2021) Page Start: 64 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Coherently strained and dislocation‐free architectured AlGaN/GaN submicron‐sized structures. Issue 2 (17th July 2021) Authors: Khalilian, Maryam; Persson, Axel; Lindgren, David; Rosén, Martin; Lenrick, Filip; Colvin, Jovana; Ohlsson, B. Jonas; Timm, Rainer; Wallenberg, Reine; Samuelson, Lars; Gustafsson, Anders Journal: Nano select Issue: Volume 3:Issue 2(2022) Page Start: 471 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Contrast – a lightweight Python framework for beamline orchestration and data acquisition. (8th June 2021) Authors: Björling, Alexander; Weninger, Clemens; Kahnt, Maik; Kalbfleisch, Sebastian; Johansson, Ulf; Sala, Simone; Lenrick, Filip; Thånell, Karina Journal: Journal of synchrotron radiation Issue: Volume 28:Part 4(2021) Page Start: 1253 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 13 (23rd March 2022) Authors: Dzhigaev, Dmitry; Svensson, Johannes; Krishnaraja, Abinaya; Zhu, Zhongyunshen; Ren, Zhe; Liu, Yi; Kalbfleisch, Sebastian; Björling, Alexander; Lenrick, Filip; Balogh, Zoltan Imre; Hammarberg, Susanna; Wallentin, Jesper; Timm, Rainer; Wernersson, Lars-Erik; Mikkelsen, Anders Journal: Nanoscale Issue: Volume 14:Issue 13(2022) Page Start: 5247 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Dislocation‐Free and Atomically Flat GaN Hexagonal Microprisms for Device Applications. Issue 30 (24th June 2020) Authors: Khalilian, Maryam; Bi, Zhaoxia; Johansson, Jonas; Lenrick, Filip; Hultin, Olof; Colvin, Jovana; Timm, Rainer; Wallenberg, Reine; Ohlsson, Jonas; Pistol, Mats‐Erik; Gustafsson, Anders; Samuelson, Lars Journal: Small Issue: Volume 16:Issue 30(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Evaluation of tool wear mechanisms and tool performance in machining single-phase tungsten. (January 2021) Authors: Olsson, Mike; Bushlya, Volodymyr; Lenrick, Filip; Ståhl, Jan-Eric Journal: International journal of refractory metals & hard materials Issue: Volume 94(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures. (13th November 2013) Authors: Lenrick, Filip; Ek, Martin; Jacobsson, Daniel; Borgström, Magnus T.; Wallenberg, L. Reine Journal: Microscopy and microanalysis Issue: Volume 20:Number 1(2014:Feb.) Page Start: 133 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures. (13th November 2013) Authors: Lenrick, Filip; Ek, Martin; Jacobsson, Daniel; Borgström, Magnus T.; Wallenberg, L. Reine Journal: Microscopy and microanalysis Issue: Volume 20:Number 1(2014:Feb.) Page Start: 133 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures. (13th November 2013) Authors: Lenrick, Filip; Ek, Martin; Jacobsson, Daniel; Borgström, Magnus T.; Wallenberg, L. Reine Journal: Microscopy and microanalysis Issue: Volume 20:Number 1(2014:Feb.) Page Start: 133 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures. (13th November 2013) Authors: Lenrick, Filip; Ek, Martin; Jacobsson, Daniel; Borgström, Magnus T.; Wallenberg, L. Reine Journal: Microscopy and microanalysis Issue: Volume 20:Number 1(2014:Feb.) Page Start: 133 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗