1. Determination of Phonon Deformation Potentials in Carbon-Doped Silicon. (20th July 2018) Authors: Yoshioka, Kazutoshi; Yokogawa, Ryo; Murakami, Tatsumi; Komago, Shota; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 419 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Strain evaluation in Ge and Sn implanted Si layers with laser and rapid thermal annealing. (December 2020) Authors: Komago, Shota; Yokogawa, Ryo; Yoshioka, Kazutoshi; Borland, John O.; Kuroi, Takashi; Kawasaki, Yoji; Ogura, Atsushi Journal: Materials science in semiconductor processing Issue: Volume 120(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Strain Evaluation of Laser-Annealed SiGe Thin Layers. (20th July 2018) Authors: Komago, Shota; Murakami, Tatsumi; Yoshioka, Kazutoshi; Yokogawa, Ryo; Borland, John O; Kuroi, Takashi; Tabata, Toshiyuki; Huet, Karim; Horiguchi, Naoto; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 59 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗