1. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. (March 2016) Authors: Morin, Pierre; Maitrejean, Sylvain; Allibert, Frederic; Augendre, Emmanuel; Liu, Qing; Loubet, Nicolas; Grenouillet, Laurent; Pofelski, Alexandre; Chen, Kangguo; Khakifirooz, Ali; Wacquez, Romain; Reboh, Shay; Bonnevialle, Aurore; le Royer, Cyrille; Morand, Yves; Kanyandekwe, Joel; Chanemougamme,... Journal: Solid-state electronics Issue: Volume 117(2016) Page Start: 100 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. CMP Challenges for Advanced Technology Nodes beyond Si. (9th May 2017) Authors: Zhang, John H; Tsai, Stan; Surisetty, Charan; Fronheiser, Jody; Siddiqui, Shariq; Bentley, Steven; Patlolla, Raghuveer; Canaperi, Donald F.; Kleemeier, Walter; Labelle, Cathy Journal: MRS advances Issue: Volume 2:Number 51(2017) Page Start: 2891 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. CMP Challenges for Advanced Technology Nodes. (16th May 2017) Authors: Zhang, John H; Huang, Haigou; Greene, Andrew M.; Xie, Ruilong; Seo, Soon-Cheon; Montanini, Pietro; Tseng, Wei-Tsu; Tsai, Stan; Malley, Matthew; Fang, Qiang; Patlolla, Raghuveer; Koli, Dinesh; Guo, Dechao; Canaperi, Donald F.; Surisetty, Charan; Wynne, Jean E; Kleemeier, Walter; Labelle, Cathy Journal: MRS advances Issue: Volume 2:Number 44(2017) Page Start: 2361 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Mechanical Analyses of Extended and Localized UTBB Stressors Formed with Ge Enrichment Techniques. (31st March 2015) Authors: Morin, Pierre Francois; Grenouillet, Laurent; Loubet, Nicolas; Pofelski, Alexandre; Lu, Darsen; Liu, Qing; Augendre, Emmanuel; Maitrejean, Sylvain; Fiori, Vincent; de Salvo, Barbara; Doris, Bruce; Kleemeier, Walter Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 57 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗