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3. Correction: Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 13 (23rd March 2022)

4. Design and performance of a dedicated coherent X‐ray scanning diffraction instrument at beamline NanoMAX of MAX IV. (16th March 2022)

8. NanoMAX: the hard X‐ray nanoprobe beamline at the MAX IV Laboratory. (5th October 2021)

9. Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction. Issue 27 (12th June 2020)