1. Quality systems handbook. (1994) Other Names: Hoyle, David Record Type: Book Extent: 1 online resource (xii, 380 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. ISO 9000 Quality Systems Handbook-updated for the ISO 9001: 2015 standard : Increasing the Quality of an Organization’s Outputs /: Increasing the Quality of an Organization’s Outputs. (2017) Authors: Hoyle, David Record Type: Book Extent: 1 online resource (892 pages), (101 illustrations) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. The Ultra-stable Scanning Transmission Electron Holography Microscope (STEHM). (August 2015) Authors: Herring, Rodney A.; Hoyle, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 347 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. At-Focus Observations of High Quality Electron Vortex Beams Created from Ferromagnetic Rods. (August 2015) Authors: Blackburn, Arthur M.; Loudon, James C.; Herring, Rodney; Hrabec, Ales; Hoyle, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 501 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging. (August 2015) Authors: Howe, Jane; Hashimoto, Yoichiro; Wang, Xue; Vara, Madeline; Hoyle, David; Schamp, Tom; Xia, Younan; Joy, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1265 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Secondary Electron Yield at High Voltages up to 300 keV. (August 2015) Authors: Howe, Jane; Hoyle, David; Ueda, Kota; Dogel, Stas; Hosseinkhannazer, Hooman; Reynolds, Matthew; Veillette, Rene; Trudeau, Michel L.; Joy, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1705 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Low Dose Electron Holography: First Steps. (August 2015) Authors: Voelkl, Edgar; Herring, Rodney; Bammes, Benjamin; Hoyle, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1951 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Secondary Electron Yield at High Voltages up to 300 keV. (23rd September 2015) Authors: Howe, Jane; Hoyle, David; Ueda, Kota; Dogel, Stas; Hosseinkhannazer, Hooman; Reynolds, Matthew; Veillette, Rene; Trudeau, Michel L.; Joy, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1705 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging. (23rd September 2015) Authors: Howe, Jane; Hashimoto, Yoichiro; Wang, Xue; Vara, Madeline; Hoyle, David; Schamp, Tom; Xia, Younan; Joy, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1265 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. At-Focus Observations of High Quality Electron Vortex Beams Created from Ferromagnetic Rods. (23rd September 2015) Authors: Blackburn, Arthur M.; Loudon, James C.; Herring, Rodney; Hrabec, Ales; Hoyle, David Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 501 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗