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Author/Creator Hite, Jennifer K.

3. All‐epitaxial fabrication of a nanowire plasmon laser structure. Issue 3 (19th March 2014)

Authors:
Mastro, Michael A.; Freitas, Jaime A.; Hite, Jennifer K.; Eddy, Charles R.
Other Names:
Eddy, Jr. Charles R. "Chip" sponsoringEditor.; Kuball Martin sponsoringEditor.; Koleske Daniel D. sponsoringEditor.; Amano Hiroshi sponsoringEditor.
Journal:
Physica status solidi
Issue:
Volume 11:Issue 3/4(2014:Apr.)
Page Start:
754
Record Type:
Journal Article
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4. Challenges to graphene growth on SiC(0 0 0 1‾): Substrate effects, hydrogen etching and growth ambient. (January 2015)

Authors:
Robinson, Zachary R.; Jernigan, Glenn G.; Currie, Marc; Hite, Jennifer K.; Bussmann, Konrad M.; Nyakiti, Luke O.; Garces, Nelson Y.; Nath, Anindya; Rao, Mulpuri V.; Wheeler, Virginia D.; Myers-Ward, Rachael L.; Wollmershauser, James A.; Feigelson, Boris N.; Eddy, Charles R.; Gaskill, D. Kurt
Journal:
Carbon
Issue:
Volume 81(2015)
Page Start:
73
Record Type:
Journal Article
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5. Challenges to graphene growth on SiC(0 0 0 1‾): Substrate effects, hydrogen etching and growth ambient. (January 2015)

Authors:
Robinson, Zachary R.; Jernigan, Glenn G.; Currie, Marc; Hite, Jennifer K.; Bussmann, Konrad M.; Nyakiti, Luke O.; Garces, Nelson Y.; Nath, Anindya; Rao, Mulpuri V.; Wheeler, Virginia D.; Myers-Ward, Rachael L.; Wollmershauser, James A.; Feigelson, Boris N.; Eddy, Charles R.; Gaskill, D. Kurt
Journal:
Carbon
Issue:
Volume 81(2015)
Page Start:
73
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

6. Defect Characterization of Multicycle Rapid Thermal Annealing Processed p-GaN for Vertical Power Devices. (1st January 2019)

Authors:
Wang, Yekan; Bai, Tingyu; Li, Chao; Tadjer, Marko J.; Anderson, Travis J.; Hite, Jennifer K.; Mastro, Michael A.; Eddy, Charles R.; Hobart, Karl D.; Feigelson, Boris N.; Goorsky, Mark S.
Journal:
ECS journal of solid state science and technology
Issue:
Volume 8:Number 2(2019)
Page Start:
P70
Record Type:
Journal Article
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7. Defect Characterization of Multicycle Rapid Thermal Annealing Processed p-GaN for Vertical Power Devices. (9th February 2019)

Authors:
Wang, Yekan; Bai, Tingyu; Li, Chao; Tadjer, Marko J.; Anderson, Travis J.; Hite, Jennifer K.; Mastro, Michael A.; Eddy, Charles R.; Hobart, Karl D.; Feigelson, Boris N.; Goorsky, Mark S.
Journal:
ECS journal of solid state science and technology
Issue:
Volume 8:Number 2(2019)
Page Start:
P70
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

8. Electrothermal evaluation of thick GaN epitaxial layers and AlGaN/GaN high-electron-mobility transistors on large-area engineered substrates. (16th November 2017)

Authors:
Anderson, Travis J.; Koehler, Andrew D.; Tadjer, Marko J.; Hite, Jennifer K.; Nath, Anindya; Mahadik, Nadeemullah A.; Aktas, Ozgur; Odnoblyudov, Vladimir; Basceri, Cem; Hobart, Karl D.; Kub, Francis J.
Journal:
Applied physics express
Issue:
Volume 10:Number 12(2017)
Page Start:
Record Type:
Journal Article
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9. Exploiting Phonon‐Resonant Near‐Field Interaction for the Nanoscale Investigation of Extended Defects. (20th January 2020)

Authors:
Hauer, Benedikt; Marvinney, Claire E.; Lewin, Martin; Mahadik, Nadeemullah A.; Hite, Jennifer K.; Bassim, Nabil; Giles, Alexander J.; Stahlbush, Robert E.; Caldwell, Joshua D.; Taubner, Thomas
Journal:
Advanced functional materials
Issue:
Volume 30:Number 10(2020)
Page Start:
n/a
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗