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You searched for: Author/Creator Heo, Sung

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1. Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates. (13th April 2016)

2. Bevel Structure Based XPS Analysis as a Non‐Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors. Issue 5 (10th April 2021)

3. Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering. Issue 4 (5th January 2018)

5. Deep level trapped defect analysis in CH3NH3PbI3 perovskite solar cells by deep level transient spectroscopy. Issue 5 (8th March 2017)

6. Deep level trapped defect analysis in CH3NH3PbI3 perovskite solar cells by deep level transient spectroscopy. Issue 5 (8th March 2017)

7. Dimensionally Engineered Perovskite Heterostructure for Photovoltaic and Optoelectronic Applications. Issue 45 (30th October 2019)

9. Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputtering. Issue 1 (11th December 2017)

10. Direct characterization of the energy level alignments and molecular components in an organic hetero-junction by integrated photoemission spectroscopy and reflection electron energy loss spectroscopy analysis. (15th July 2016)