Author/Creator: Guo, Hong-xia - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Guo, Hong-xia

1. 3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment. Issue 8 (July 2015)

Authors:: Zhang, Jin-xin; He, Chao-hui; Guo, Hong-xia; Tang, Du; Xiong, Cen; Li, Pei; Wang, Xin
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 8(2015)
Page Start:: 1180
Record Type:: Journal Article
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2. Crystallization behavior and mechanical properties of poly(lactic acid) complex fiber toughened by carbon nanotube nanocapsules. Issue 14 (July 2018)

Authors:: Liu, Shu-qiang; Wu, Gai-hong; Xiao, Yun-chao; Guo, Hong-xia; Shao, Fen-juan
Journal:: Textile research journal
Issue:: Volume 88:Issue 14(2018)
Page Start:: 1616
Record Type:: Journal Article
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3. Simulation of substrate contact effects on heavy ion-induced current transient in SiGe HBT. (April 2019)

Authors:: Wei, Jia-nan; He, Chao-hui; Li, Pei; Li, Yong-hong; Guo, Hong-xia
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 28
Record Type:: Journal Article
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4. Single event effects in commercial FRAM and mitigation technique using neutron-induced displacement damage. (January 2019)

Authors:: Wei, Jia-nan; Guo, Hong-xia; Zhang, Feng-qi; He, Chao-hui; Ju, An-an; Li, Yong-hong
Journal:: Microelectronics and reliability
Issue:: Volume 92(2019)
Page Start:: 149
Record Type:: Journal Article
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5. Strategies and criteria targeting the reform and development for the teaching resource of nursing undergraduate: A multi-center cross-sectional study. Issue 20 (21st May 2021)

Authors:: Liu, Chang-qing; Wei, Yi; Ren, Hong-fei; Zhou, Qian; Chen, Juan; Guo, Hong-xia; Li, Xiao-ling; Ni, Zhao; Cao, Xiao-yi; Li, Ka; Li, Ji-ping
Other Names:: Sayil. Cigdem section editor.
Journal:: Medicine
Issue:: Volume 100:Issue 20(2021)
Page Start:
Record Type:: Journal Article
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6. Study on proton-induced single event effect of SiC diode and MOSFET. (September 2021)

Authors:: Zhang, Hong; Guo, Hong-xia; Zhang, Feng-qi; Lei, Zhi-feng; Pan, Xiao-yu; Liu, Yi-tian; Gu, Zhao-qiao; Ju, An-an; Zhong, Xiang-li; Ouyang, Xiao-ping
Journal:: Microelectronics and reliability
Issue:: Volume 124(2021)
Page Start:
Record Type:: Journal Article
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