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1. Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data. (30th January 2017)

6. Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments. (26th April 2017)

8. Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data. (14th March 2017)

9. Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries. (20th February 2017)