Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea. (26th April 2017)

Record Type:: Journal Article
Title:: Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea. (26th April 2017)
Main Title:: Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea
Editors:: Thuvander, Mattias
Cairney, Julie
Gerstl, Stephan
Abstract:
Is Part Of:: Microscopy and microanalysis. Volume 23:Number 2(2017)
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 2(2017)
Issue Display:: Volume 23, Issue 2 (2017)
Year:: 2017
Volume:: 23
Issue:: 2
Issue Sort Value:: 2017-0023-0002-0000
Page Start:: 187
Page End:: 193
Publication Date:: 2017-04-26
Subjects:: Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:: https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:: 10.1017/S1431927617000411 ↗
Languages:: English
ISSNs:: 1431-9276
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 421.xml