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You searched for: Author/Creator Gamarra, P.

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1. Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films. (15th February 2017)

2. Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs. Issue 9 (August 2015)

4. Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. (September 2018)