1. Effects of BEOL on self-heating and thermal coupling in SiGe multi-finger HBTs under real operating condition. (January 2016) Authors: Dwivedi, A.D.D.; Chakravorty, Anjan; D'Esposito, Rosario; Sahoo, Amit Kumar; Fregonese, Sebastien; Zimmer, Thomas Journal: Solid-state electronics Issue: Volume 115 Part A(2016) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Enhanced Intrinsic Voltage Gain in Artificially Stacked Bilayer CVD Graphene Field Effect Transistors. Issue 11 (20th September 2017) Authors: Pandey, Himadri; Aguirre‐Morales, Jorge‐Daniel; Kataria, Satender; Fregonese, Sebastien; Passi, Vikram; Iannazzo, Mario; Zimmer, Thomas; Alarcon, Eduard; Lemme, Max C. Other Names: Seyller Thomas guestEditor. Journal: Annalen der Physik Issue: Volume 529:Issue 11(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. SiGe HBTs Optimization for Wireless Power Amplifier Applications. (29th December 2010) Authors: Mans, Pierre-Marie; Jouan, Sebastien; Fregonese, Sebastien; Vandelle, Benoit; Pache, Denis; Arnaud, Caroline; Maneux, Cristell; Zimmer, Thomas Other Names: Marbell Marvin Academic Editor. Journal: Active and passive electronic components Issue: Volume 2010(2010) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. TCAD and EM co-simulation method to verify SiGe HBT measurements up to 500 GHz. (December 2020) Authors: Panda, Soumya Ranjan; Fregonese, Sebastien; Deng, Marina; Chakravorty, Anjan; Zimmer, Thomas Journal: Solid-state electronics Issue: Volume 174(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. TCAD Calibration of High-Speed Si/SiGe HBTs in 55-nm BiCMOS. (18th August 2016) Authors: VU, Van-Tuan; Celi, Didier; Zimmer, Thomas; Fregonese, Sebastien; Chevalier, Pascal Journal: ECS transactions Issue: Volume 75:Number 8(2016) Page Start: 113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗