Author/Creator: Fregonese, Sebastien - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Fregonese, Sebastien

1. Effects of BEOL on self-heating and thermal coupling in SiGe multi-finger HBTs under real operating condition. (January 2016)

Authors:: Dwivedi, A.D.D.; Chakravorty, Anjan; D'Esposito, Rosario; Sahoo, Amit Kumar; Fregonese, Sebastien; Zimmer, Thomas
Journal:: Solid-state electronics
Issue:: Volume 115 Part A(2016)
Page Start:: 1
Record Type:: Journal Article
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2. Enhanced Intrinsic Voltage Gain in Artificially Stacked Bilayer CVD Graphene Field Effect Transistors. Issue 11 (20th September 2017)

Authors:: Pandey, Himadri; Aguirre‐Morales, Jorge‐Daniel; Kataria, Satender; Fregonese, Sebastien; Passi, Vikram; Iannazzo, Mario; Zimmer, Thomas; Alarcon, Eduard; Lemme, Max C.
Other Names:: Seyller Thomas guestEditor.
Journal:: Annalen der Physik
Issue:: Volume 529:Issue 11(2017)
Page Start:: n/a
Record Type:: Journal Article
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3. SiGe HBTs Optimization for Wireless Power Amplifier Applications. (29th December 2010)

Authors:: Mans, Pierre-Marie; Jouan, Sebastien; Fregonese, Sebastien; Vandelle, Benoit; Pache, Denis; Arnaud, Caroline; Maneux, Cristell; Zimmer, Thomas
Other Names:: Marbell Marvin Academic Editor.
Journal:: Active and passive electronic components
Issue:: Volume 2010(2010)
Page Start:
Record Type:: Journal Article
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4. TCAD and EM co-simulation method to verify SiGe HBT measurements up to 500 GHz. (December 2020)

Authors:: Panda, Soumya Ranjan; Fregonese, Sebastien; Deng, Marina; Chakravorty, Anjan; Zimmer, Thomas
Journal:: Solid-state electronics
Issue:: Volume 174(2020)
Page Start:
Record Type:: Journal Article
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5. TCAD Calibration of High-Speed Si/SiGe HBTs in 55-nm BiCMOS. (18th August 2016)

Authors:: VU, Van-Tuan; Celi, Didier; Zimmer, Thomas; Fregonese, Sebastien; Chevalier, Pascal
Journal:: ECS transactions
Issue:: Volume 75:Number 8(2016)
Page Start:: 113
Record Type:: Journal Article
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