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Author/Creator Fajardo, P.

1. Characterization of GaAs:Cr sensors using the charge-integrating JUNGFRAU readout chip. (21st May 2019)

Authors:
Greiffenberg, D.; Andrä, M.; Barten, R.; Bergamaschi, A.; Busca, P.; Brückner, M.; Alvarez, S. Chiriotti; Chsherbakov, I.; Dinapoli, R.; Fajardo, P.; Fröjdh, E.; Lopez-Cuenca, C.; Lozinskaya, A.; Meyer, M.; Mezza, D.; Mozzanica, A.; Redford, S.; Ruat, M.; Ruder, C.; Schmitt, B.
Journal:
Journal of instrumentation
Issue:
Volume 14:Number 5(2019)
Page Start:
P05020
Record Type:
Journal Article
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6. Four-quadrant silicon and silicon carbide photodiodes for beam position monitor applications: electrical characterization and electron irradiation effects. (30th January 2018)

Authors:
Rafí, J.M.; Pellegrini, G.; Godignon, P.; Quirion, D.; Hidalgo, S.; Matilla, O.; Fontserè, A.; Molas, B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Pothin, D.; Fajardo, P.
Journal:
Journal of instrumentation
Issue:
Volume 13:Number 1(2018:Jan.)
Page Start:
C01045
Record Type:
Journal Article
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Available online (eLD content is only available in our Reading Rooms) ↗

9. Observation of radiation damage in CdTe Schottky sensors created by 20 keV photons. (1st June 2022)

Authors:
Meyer, M.; Andrä, M.; Barten, R.; Bergamaschi, A.; Brückner, M.; Busca, P.; Carulla Areste, M.; Chiriotti, S.; Dinapoli, R.; Fajardo, P.; Fröjdh, E.; Greiffenberg, D.; Heymes, J.; Hinger, V.; Kozlowski, P.; Lopez-Cuenca, C.; Mezza, D.; Mozzanica, A.; Redford, S.; Ruat, M.
Journal:
Journal of instrumentation
Issue:
Volume 17:Number 6(2022)
Page Start:
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗