Four-quadrant silicon and silicon carbide photodiodes for beam position monitor applications: electrical characterization and electron irradiation effects. (30th January 2018)

Record Type:: Journal Article
Title:: Four-quadrant silicon and silicon carbide photodiodes for beam position monitor applications: electrical characterization and electron irradiation effects. (30th January 2018)
Main Title:: Four-quadrant silicon and silicon carbide photodiodes for beam position monitor applications: electrical characterization and electron irradiation effects
Authors:: Rafí, J.M.
Pellegrini, G.
Godignon, P.
Quirion, D.
Hidalgo, S.
Matilla, O.
Fontserè, A.
Molas, B.
Takakura, K.
Tsunoda, I.
Yoneoka, M.
Pothin, D.
Fajardo, P.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 13:Number 1(2018:Jan.)
Journal:: Journal of instrumentation
Issue:: Volume 13:Number 1(2018:Jan.)
Issue Display:: Volume 13, Issue 1 (2018)
Year:: 2018
Volume:: 13
Issue:: 1
Issue Sort Value:: 2018-0013-0001-0000
Page Start:: C01045
Page End:: C01045
Publication Date:: 2018-01-30
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/13/01/C01045 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 6383.xml