1. 14-3-3 structure, function and role in neurodegenerative diseases, trafficking and nuclear signalling. (June 2002) Authors: Aitken, A.; Baxter, H. C.; Dubois, T.; Mackie, S.; Peden, A.; Zemlickova, E. Journal: Biochemical Society transactions Issue: Volume 30:Number 3(2002) Page Start: A61 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 14-3-3 ζ docking to the M3 muscarinic receptor. (June 2001) Authors: Robertson, D. N.; Beggs, J. K.; Collins, D. M.; Johnson, M. S.; Holland, P. J.; Lutz, E. M.; Dubois, T.; Aitken, A.; Mitchell, R. Journal: Biochemical Society transactions Issue: Volume 29:Number 3(2001) Page Start: A80 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Casein Kinase I (CKI) Associates with Centaurin-α. (June 1999) Authors: Dubois, T.; Kerai, P.; Howell, S.; Jackson, T.R.; Theibert, A.B.; Aitken, A. Journal: Biochemical Society transactions Issue: Volume 27:Number 3(1999) Page Start: A105 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Characterization and model of temperature effect on the conducted immunity of Op-Amp. Issue 9 (August 2015) Authors: Dubois, T.; Hairoud, S.; Gomes de Oliveira, M.H.; Frémont, H.; Duchamp, G. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 2055 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Destruction analyses of power supplies due to electric pulse. (September 2019) Authors: Mejecaze, G.; Dubois, T.; Curos, L.; Puybaret, F.; Vinassa, J.-M. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. (September 2017) Authors: Hairoud-Airieau, S.; Duchamp, G.; Dubois, T.; Delétage, J.-Y.; Durier, A.; Frémont, H. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 674 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. (September 2018) Authors: Girard, M.; Dubois, T.; Hoffmann, P.; Duchamp, G. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 914 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Experimental Measurement of the Solid Particle Concentration in Geophysical Turbulent Gas‐Particle Mixtures. Issue 5 (31st May 2018) Authors: Weit, A.; Roche, O.; Dubois, T.; Manga, M. Journal: Journal of geophysical research Issue: Volume 123:Issue 5(2018) Page Start: 3747 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Issue 9 (August 2015) Authors: Ayed, A.; Dubois, T.; Levant, J.-L.; Duchamp, G. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 2067 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Investigation of critical parameters in power supplies components failure due to electric pulse. (November 2020) Authors: Curos, L.; Dubois, T.; Mejecaze, G.; Puybaret, F.; Plano, B.; Vinassa, J.-M. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗