Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. (September 2017)

• Record Type: Journal Article
• Authors: Hairoud-Airieau, S.; Duchamp, G.; Dubois, T.; Delétage, J.-Y.; Durier, A.; Frémont, H.
• Is Part Of: Microelectronics and reliability. Volume 76/77(2017)
• Page Start: 674
• Page End: 679
• Publication Date: 2017-09
• Subjects: Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2017.07.030
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: In this paper, we develop a conducted immunity model based on ICIM-CI approach (Integrated Circuit Immunity Model Conducted Immunity) that takes into account the effect of ageing in the immunity characteristics of a bandgap voltage reference. The modelling approach is briefly described. Then the measurement setup and the ageing procedure are detailed. Finally, the model is established and validated thanks to measurements before and after ageing. This model allows to anticipate the long term electromagnetic compliance of the circuit. Highlights: Effect of ageing on the conducted immunity of electronic components. Electrical stress can modify the electrical behaviour of electronic components. ICIM-CI model can be improved by taking into account ageing effects.