1. Radiation hardness study of the ePix100 sensor and ASIC under direct illumination at the European XFEL. (10th September 2021) Authors: Klačková, I.; Ahmed, K.; Blaj, G.; Cascella, M.; Cerantola, V.; Chang, C.; Dragone, A.; Göde, S.; Hauf, S.; Kenney, C.; Segal, J.; Kuster, M.; Šagátová, A. Journal: Journal of instrumentation Issue: Volume 16:Number 9(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Simulation of charge readout with segmented tiles in nEXO. (24th September 2019) Authors: Li, Z.; Cen, W.R.; Robinson, A.; Moore, D.C.; Wen, L.J.; Odian, A.; Kharusi, S. Al; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Brodsky, J.P.; Brown, E.; Brunner, T.; Caden, E.; Cao, G.F.; Cao, L. Journal: Journal of instrumentation Issue: Volume 14:Number 9(2019) Page Start: P09020 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Study of silicon photomultiplier performance in external electric fields. (17th September 2018) Authors: Sun, X.L.; Tolba, T.; Cao, G.F.; Lv, P.; Wen, L.J.; Odian, A.; Vachon, F.; Alamre, A.; Albert, J.B.; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J. P.; Brown, E.; Brunner, T. Journal: Journal of instrumentation Issue: Volume 13:Number 9(2018:Sep.) Page Start: T09006 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗