Author/Creator: Crupi, F. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Crupi, F.

1. Benchmarks of a III-V TFET technology platform against the 10-nm CMOS FinFET technology node considering basic arithmetic circuits. (February 2017)

Authors:: Strangio, S.; Palestri, P.; Lanuzza, M.; Esseni, D.; Crupi, F.; Selmi, L.
Journal:: Solid-state electronics
Issue:: Volume 128(2017)
Page Start:: 37
Record Type:: Journal Article
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2. Digital and analog TFET circuits: Design and benchmark. (August 2018)

Authors:: Strangio, S.; Settino, F.; Palestri, P.; Lanuzza, M.; Crupi, F.; Esseni, D.; Selmi, L.
Journal:: Solid-state electronics
Issue:: Volume 146(2018)
Page Start:: 50
Record Type:: Journal Article
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3. Gate‐level body biasing for subthreshold logic circuits: analytical modeling and design guidelines. (19th August 2014)

Authors:: Albano, D.; Lanuzza, M.; Taco, R.; Crupi, F.
Journal:: International journal of circuit theory and applications
Issue:: Volume 43:Number 11(2015:Nov.)
Page Start:: 1523
Record Type:: Journal Article
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4. On recoverable behavior of PBTI in AlGaN/GaN MOS-HEMT. (June 2017)

Authors:: Acurio, E.; Crupi, F.; Magnone, P.; Trojman, L.; Meneghesso, G.; Iucolano, F.
Journal:: Solid-state electronics
Issue:: Volume 132(2017)
Page Start:: 49
Record Type:: Journal Article
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5. TCAD modeling of bias temperature instabilities in SiC MOSFETs. (November 2021)

Authors:: Carangelo, G.; Reggiani, S.; Consentino, G.; Crupi, F.; Meneghesso, G.
Journal:: Solid-state electronics
Issue:: Volume 185(2021)
Page Start:
Record Type:: Journal Article
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