Author/Creator: Christou, Aris - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Christou, Aris

1. ALD TiN Schottky Gates for Improved Electrical and Thermal Stability in III-N Devices. (14th August 2017)

Authors:: Wheeler, Virginia D.; Anderson, Travis J; Ahn, Shihyun; Shahin, David I; Tadjer, Marko J; Koehler, Andrew D.; Hobart, Karl D; Ren, Fan; Kub, Francis J; Christou, Aris; Eddy, Charles R.
Journal:: ECS transactions
Issue:: Volume 80:Number 3(2017)
Page Start:: 17
Record Type:: Journal Article
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2. Electrical and Thermal Stability of ALD-Deposited TiN Transition Metal Nitride Schottky Gates for AlGaN/GaN HEMTs. (1st January 2016)

Authors:: Shahin, David I.; Anderson, Travis J.; Wheeler, Virginia D.; Tadjer, Marko J.; Koehler, Andrew D.; Hobart, Karl D.; Eddy, Charles R.; Kub, Francis J.; Christou, Aris
Journal:: ECS journal of solid state science and technology
Issue:: Volume 5:Number 7(2016)
Page Start:: Q204
Record Type:: Journal Article
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3. Electrical and Thermal Stability of ALD-Deposited TiN Transition Metal Nitride Schottky Gates for AlGaN/GaN HEMTs. (2nd June 2016)

Authors:: Shahin, David I.; Anderson, Travis J.; Wheeler, Virginia D.; Tadjer, Marko J.; Koehler, Andrew D.; Hobart, Karl D.; Eddy, Charles R.; Kub, Francis J.; Christou, Aris
Journal:: ECS journal of solid state science and technology
Issue:: Volume 5:Number 7(2016)
Page Start:: Q204
Record Type:: Journal Article
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4. Enhancement mode AlGaN/GaN MOS high-electron-mobility transistors with ZrO2 gate dielectric deposited by atomic layer deposition. (28th June 2016)

Authors:: Anderson, Travis J.; Wheeler, Virginia D.; Shahin, David I.; Tadjer, Marko J.; Koehler, Andrew D.; Hobart, Karl D.; Christou, Aris; Kub, Francis J.; Eddy, Charles R.
Journal:: Applied physics express
Issue:: Volume 9:Number 7(2016:Jul.)
Page Start:
Record Type:: Journal Article
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5. In-Situ Characterization of Defect Dynamics in 4H-SiC Power Diodes under High-Voltage Stressing. (13th April 2015)

Authors:: Shenai, Krishna; Raghothamachar, Balaji; Dudley, Michael; Christou, Aris
Journal:: ECS transactions
Issue:: Volume 66:Number 1(2015)
Page Start:: 205
Record Type:: Journal Article
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6. Prognostics of IGBT modules based on the approach of particle filtering. (January 2019)

Authors:: Lu, Yizhou; Christou, Aris
Journal:: Microelectronics and reliability
Issue:: Volume 92(2019)
Page Start:: 96
Record Type:: Journal Article
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7. Radiation Effects in Diamond pHEMTs. (3rd July 2019)

Authors:: Thapa, Aayush; Shahin, David; Christou, Aris
Journal:: ECS transactions
Issue:: Volume 92:Number 7(2019)
Page Start:: 141
Record Type:: Journal Article
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8. Reliability limitations from crystal defects in thick GaN epitaxial layers. (November 2020)

Authors:: Christou, Aris
Journal:: Microelectronics and reliability
Issue:: Volume 114(2020)
Page Start:
Record Type:: Journal Article
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9. Ultraviolet detector based on graphene/SiC heterojunction. (25th March 2015)

Authors:: Anderson, Travis J.; Hobart, Karl D.; Greenlee, Jordan D.; Shahin, David I.; Koehler, Andrew D.; Tadjer, Marko J.; Imhoff, Eugene A.; Myers-Ward, Rachael L.; Christou, Aris; Kub, Francis J.
Journal:: Applied physics express
Issue:: Volume 8:Number 4(2015:Apr.)
Page Start:
Record Type:: Journal Article
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