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Author/Creator Choi, Sung-Jin

1. 19‐3: Late-News Paper: Universal Method to Determine the Dynamic NBIS‐ and PBS‐induced Instabilities on Self‐aligned Coplanar InGaZnO Thin‐film Transistors. Issue 1 (30th May 2018)

Authors:
Jang, Jun Tae; Yu, Hye Ri; Ahn, Geumho; Choi, Sung-Jin; Kim, Dong Myong; Kim, Yong-Sung; Oh, Saeroonter; Baeck, Ju Heyuck; Bae, Jong Uk; Park, Kwon-Shik; Yoon, Soo Young; Kang, In Byeong; Kim, Dae Hwan
Journal:
Digest of technical papers
Issue:
Volume 49:Issue 1(2018)
Page Start:
232
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. 21‐4: Distinguished Paper: Experimental Decomposition of the Positive Bias Temperature Stress‐induced Instability in Self‐aligned Coplanar InGaZnO Thin‐film Transistors and its Modeling based on the Multiple Stretched‐exponential Functions. Issue 1 (May 2017)

Authors:
Kim, Dae Hwan; Choi, Sungju; Jang, Juntae; Kang, Hara; Kim, Dong Myong; Choi, Sung-Jin; Kim, Yong-Sung; Oh, Saeroonter; Baeck, Ju Heyuck; Bae, Jong Uk; Park, Kwon-Shik; Yoon, Soo Young; Kang, In Byeong
Journal:
Digest of technical papers
Issue:
Volume 48:Issue 1(2017)
Page Start:
298
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

3. 21‐4: Distinguished Paper: Experimental Decomposition of the Positive Bias Temperature Stress‐induced Instability in Self‐aligned Coplanar InGaZnO Thin‐film Transistors and its Modeling based on the Multiple Stretched‐exponential Functions. Issue 1 (2nd June 2017)

Authors:
Kim, Dae Hwan; Choi, Sungju; Jang, Juntae; Kang, Hara; Kim, Dong Myong; Choi, Sung-Jin; Kim, Yong-Sung; Oh, Saeroonter; Baeck, Ju Heyuck; Bae, Jong Uk; Park, Kwon-Shik; Yoon, Soo Young; Kang, In Byeong
Journal:
Digest of technical papers
Issue:
Volume 48:Issue 1(2017)
Page Start:
298
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗