1. Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy. (October 2015) Authors: Achour, H.; Cretu, B.; Simoen, E.; Routoure, J.-M.; Carin, R.; Benfdila, A.; Aoulaiche, M.; Claeys, C. Journal: Solid-state electronics Issue: Volume 112(2015) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part I: Theory and methodology. (February 2017) Authors: Boudier, D.; Cretu, B.; Simoen, E.; Carin, R.; Veloso, A.; Collaert, N.; Thean, A. Journal: Solid-state electronics Issue: Volume 128(2017) Page Start: 102 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part II: Measurements and results. (February 2017) Authors: Boudier, D.; Cretu, B.; Simoen, E.; Carin, R.; Veloso, A.; Collaert, N.; Thean, A. Journal: Solid-state electronics Issue: Volume 128(2017) Page Start: 109 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors – Physical interpretation of transport phenomena. (December 2018) Authors: Nafaa, B.; Cretu, B.; Ismail, N.; Touayar, O.; Carin, R.; Simoen, E.; Veloso, A. Journal: Solid-state electronics Issue: Volume 150(2018) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗