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You searched for: Author/Creator Carin, R.Limit your search
- Carin, R. [remove] 4
- 621.38152 4
- Semiconducteurs -- Périodiques 4
- Semiconductors -- Periodicals 4
- SOI -- FinFET -- Strain engineering -- Low temperature -- Low frequency noise spectroscopy -- Traps in silicon film 1
- Triple-gate -- FinFET -- Low frequency noise -- 1/f noise -- Generation recombination -- Traps 1
- Triple-gate -- FinFET -- Low frequency noise -- 1/f noise -- Generation-recombination -- Traps 1
- UTBOX -- FD SOI MOSFET -- Liquid helium temperature -- Quantum transport -- Low frequency noise -- Carrier number fluctuations -- Mobility fluctuations 1