1. 2S-A1-4Soft Material Electron Tomography. (14th November 2017) Authors: Jinnai, Hiroshi; Higuchi, Takeshi; Zhuge, Xiaodong; Kumamoto, Akihito; Batenburg, Kees Joost; Ikuhara, Yuichi Journal: Microscopy Issue: Volume 66(2017)Supplement 1 Page Start: i12 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A feasibility study of full‐field X‐ray orientation microscopy at the onset of deformation twinning. Issue 2 (18th March 2016) Authors: Viganò, Nicola; Nervo, Laura; Valzania, Lorenzo; Singh, Gaurav; Preuss, Michael; Batenburg, Kees Joost; Ludwig, Wolfgang Journal: Journal of applied crystallography Issue: Volume 49:Issue 2(2016) Page Start: 544 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A tomographic workflow to enable deep learning for X-ray based foreign object detection. (15th November 2022) Authors: Zeegers, Mathé T.; van Leeuwen, Tristan; Pelt, Daniël M.; Coban, Sophia Bethany; van Liere, Robert; Batenburg, Kees Joost Journal: Expert systems with applications Issue: Volume 206(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. ADJUST: a dictionary-based joint reconstruction and unmixing method for spectral tomography. (1st December 2022) Authors: Zeegers, Mathé T; Kadu, Ajinkya; van Leeuwen, Tristan; Batenburg, Kees Joost Journal: Inverse problems Issue: Volume 38:Number 12(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Analysis of 3D elemental distribution in nanomaterials: Towards higher throughput and dose efficiency. (9th January 2023) Authors: Skorikov, Alexander; Batenburg, Kees Joost; Bals, Sara Journal: Journal of microscopy Issue: Volume 289:Part 3(2023) Page Start: 157 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography. (27th October 2017) Authors: Sentosun, Kadir; Lobato, Ivan; Bladt, Eva; Zhang, Yang; Palenstijn, Willem Jan; Batenburg, Kees Joost; Van Dyck, Dirk; Bals, Sara Journal: Particle and particle systems characterization Issue: Volume 34:Number 12(2017:Dec.) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Combined STEM-EDS tomography of nanowire structures. (17th October 2019) Authors: Bender, Hugo; Richard, Olivier; Kundu, Paromita; Favia, Paola; Zhong, Zhichao; Palenstijn, Willem Jan; Batenburg, Kees Joost; Wirix, Maarten; Kohr, Holger; Schoenmakers, Remco Journal: Semiconductor science and technology Issue: Volume 34:Number 11(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Comparison of convolutional neural network training strategies for cone-beam CT image segmentation. (August 2021) Authors: Minnema, Jordi; Wolff, Jan; Koivisto, Juha; Lucka, Felix; Batenburg, Kees Joost; Forouzanfar, Tymour; van Eijnatten, Maureen Journal: Computer methods and programs in biomedicine Issue: Volume 207(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Efficient high cone-angle artifact reduction in circular cone-beam CT using deep learning with geometry-aware dimension reduction. (1st July 2021) Authors: Minnema, Jordi; van Eijnatten, Maureen; der Sarkissian, Henri; Doyle, Shannon; Koivisto, Juha; Wolff, Jan; Forouzanfar, Tymour; Lucka, Felix; Batenburg, Kees Joost Journal: Physics in medicine & biology Issue: Volume 66:Number 13(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Foam‐like phantoms for comparing tomography algorithms. (12th December 2021) Authors: Pelt, Daniël M.; Hendriksen, Allard A.; Batenburg, Kees Joost Journal: Journal of synchrotron radiation Issue: Volume 29:Part 1(2022) Page Start: 254 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗