1. A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM. (January 2015) Authors: Aziza, H.; Bocquet, M.; Moreau, M.; Portal, J-M. Journal: Solid-state electronics Issue: Volume 103(2015) Page Start: 73 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A lightweight write-assist scheme for reduced RRAM variability and power. (September 2018) Authors: Aziza, H.; Hajri, B.; Mansour, M.; Chehab, A.; Perez, A. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 6 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. AC stress analysis of trench-based multi-gate transistors in a 40 nm e-NVM technology. (November 2022) Authors: Gay, R.; Marca, V. Della; Aziza, H.; Chiquet, P.; Regnier, A.; Niel, S.; Marzaki, A. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Embedded high‐precision capacitor measurement system based on ring‐oscillator. Issue 6 (1st March 2015) Authors: Welter, L.; Dreux, P.; Aziza, H.; Portal, J.‐M. Journal: Electronics letters Issue: Volume 51:Issue 6(2015) Page Start: 521 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Gate stress reliability of a novel trench-based Triple Gate Transistor. (November 2021) Authors: Gay, R.; Marca, V. Della; Aziza, H.; Laine, P.; Regnier, A.; Niel, S.; Marzaki, A. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Hot-carrier evaluation of a zero-cost transistor developed via process optimization in an embedded non-volatile memory CMOS technology. (November 2021) Authors: Devoge, P.; Aziza, H.; Lorenzini, P.; Julien, F.; Marzaki, A.; Malherbe, A.; Mantelli, M.; Cabout, T.; Delalleau, J.; Haendler, S.; Regnier, A.; Niel, S. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Hot-carrier reliability and performance study of transistors with variable gate-to-drain/source overlap. (November 2022) Authors: Devoge, P.; Aziza, H.; Lorenzini, P.; Masson, P.; Julien, F.; Marzaki, A.; Malherbe, A.; Delalleau, J.; Cabout, T.; Regnier, A.; Niel, S. Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories. (September 2016) Authors: Canet, P.; Postel-Pellerin, J.; Aziza, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 36 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories. (September 2016) Authors: Canet, P.; Postel-Pellerin, J.; Aziza, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 36 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Improvement of MOSFET matching characterization with calibrated multiplexed test structure. Issue 9 (August 2015) Authors: Welter, L.; Scotto di Quaquero, J.L.; Dreux, P.; Lopez, L.; Aziza, H.; Portal, J.M. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1328 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗