Embedded high‐precision capacitor measurement system based on ring‐oscillator. Issue 6 (1st March 2015)

• Record Type: Journal Article
• Authors: Welter, L.; Dreux, P.; Aziza, H.; Portal, J.‐M.
• Is Part Of: Electronics letters. Volume 51:Issue 6(2015)
• Page Start: 521
• Page End: 523
• Publication Date: 2015-03-01
• Subjects: capacitors -- oscillators -- capacitance measurement; embedded high‐precision capacitor measurement system -- ring‐oscillator -- electrical value measurement -- calibration system -- measurement process robustness -- power supply -- process variations -- noise immunity -- digital signature -- capacitor value; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2014.4373
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : A direct way to measure the electrical value of capacitors embedded in a circuit using a ring‐oscillator is presented. A calibration system ensures the robustness of the measurement process against temperature, power supply and process variations. Silicon results show the ability of the system to measure robustly a large range of small capacitors. The system also provides a noise immunity as the system provides a digital signature of the capacitor value.