1. Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. (September 2016) Authors: Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 541 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. (September 2016) Authors: Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 541 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. (September 2016) Authors: Brand, S.; Simon-Najasek, M.; Kögel, M.; Jatzkowski, J.; Portius, R.; Altmann, F. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 341 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. (September 2016) Authors: Brand, S.; Simon-Najasek, M.; Kögel, M.; Jatzkowski, J.; Portius, R.; Altmann, F. Journal: Microelectronics and reliability Issue: Volume 64(2016) Page Start: 341 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Distinguishing N-acetylneuraminic acid linkage isomers on glycopeptides by ion mobility-mass spectrometry. Issue 23 (1st March 2016) Authors: Hinneburg, H.; Hofmann, J.; Struwe, W. B.; Thader, A.; Altmann, F.; Varón Silva, D.; Seeberger, P. H.; Pagel, K.; Kolarich, D. Journal: Chemical communications Issue: Volume 52:Issue 23(2016) Page Start: 4381 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Exploring the thermal limit of GaN power devices under extreme overload conditions. (September 2017) Authors: Pribahsnik, F.P.; Nelhiebel, M.; Mataln, M.; Bernardoni, M.; Prechtl, G.; Altmann, F.; Poppitz, D.; Lindemann, A. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 304 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Glycophenotyping of osteoarthritic fibroblast-like synoviocytes. Issue 1 (April 2020) Authors: Toegel, S.; Führer, J.; Pichler, K.M.; Gabius, H.-J.; Kubista, B.; Martelanz, L.; Windhager, R.; Altmann, F. Journal: Osteoarthritis and cartilage Issue: Volume 28:Issue 1(2020)supplement Page Start: S212 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. (September 2017) Authors: Graff, A.; Simon-Najasek, M.; Altmann, F.; Kuzmik, J.; Gregušová, D.; Haščík, Š.; Jung, H.; Baur, T.; Grünenpütt, J.; Blanck, H. Journal: Microelectronics and reliability Issue: Volume 76/77(2017) Page Start: 338 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Inhibition of IgE binding to cross‐reactive carbohydrate determinants enhances diagnostic selectivity. Issue 10 (21st September 2013) Authors: Holzweber, F.; Svehla, E.; Fellner, W.; Dalik, T.; Stubler, S.; Hemmer, W.; Altmann, F. Journal: Allergy Issue: Volume 68:Issue 10(2013:Oct.) Page Start: 1269 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Local metal segregation as root cause for electrical shorts in highly doped pressure sensor devices. (November 2021) Authors: Simon-Najasek, M.; Diehle, P.; Große, Ch.; Hübner, S.; Brokmann, G.; Sprenger, B.; Altmann, F. Journal: Microelectronics and reliability Issue: Volume 126(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗