Author/Creator: Altmann, F. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Altmann, F.

1. Production of electroplated Co-Al2O3 nanocomposites by pulse reverse plating (PRP) and anionic surfactant. (4th July 2019)

Authors:: Albusalih, D.; Gill, S.; Weston, D.; Altmann, F.
Journal:: Transactions of the Institute of Metal Finishing
Issue:: Volume 97:Number 4(2019)
Page Start:: 203
Record Type:: Journal Article
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2. Glycophenotyping of osteoarthritic fibroblast-like synoviocytes. Issue 1 (April 2020)

Authors:: Toegel, S.; Führer, J.; Pichler, K.M.; Gabius, H.-J.; Kubista, B.; Martelanz, L.; Windhager, R.; Altmann, F.
Journal:: Osteoarthritis and cartilage
Issue:: Volume 28:Issue 1(2020)supplement
Page Start:: S212
Record Type:: Journal Article
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3. Reliability evaluation of Si-dies due to assembly issues. (September 2016)

Authors:: Naumann, F.; Gottschalk, V.; Burchard, B.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 266
Record Type:: Journal Article
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4. Magnetic field and current density imaging using off-line lock-in analysis. (September 2016)

Authors:: Kögel, M.; Altmann, F.; Tismer, S.; Brand, S.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 346
Record Type:: Journal Article
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5. Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. (September 2016)

Authors:: Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 541
Record Type:: Journal Article
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6. Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. (September 2016)

Authors:: Simon-Najasek, M.; Lorenz, G.; Lindner, A.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 248
Record Type:: Journal Article
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7. Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. (September 2016)

Authors:: Brand, S.; Simon-Najasek, M.; Kögel, M.; Jatzkowski, J.; Portius, R.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 341
Record Type:: Journal Article
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8. Local metal segregation as root cause for electrical shorts in highly doped pressure sensor devices. (November 2021)

Authors:: Simon-Najasek, M.; Diehle, P.; Große, Ch.; Hübner, S.; Brokmann, G.; Sprenger, B.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 126(2021)
Page Start:
Record Type:: Journal Article
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9. Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. (September 2016)

Authors:: Simon-Najasek, M.; Lorenz, G.; Lindner, A.; Altmann, F.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 248
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. (September 2016)

Authors:: Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H.
Journal:: Microelectronics and reliability
Issue:: Volume 64(2016)
Page Start:: 541
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗