Cite
APA Citation
Thoutam, L. R., Mathew, R., Ajayan, J., Tayal, S., & Nair, S. V. (2023). a critical review of fabrication challenges and reliability issues in top/bottom gated MoS2 field-effect transistors. Nanotechnology, 34, . http://access.bl.uk/ark:/81055/vdc_100182836545.0x00003a