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APA Citation
Lee, S., Jeong, J., Kim, Y., Han, S. M., Kiener, D., & Oh, S. H. (2016). fIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior. Acta materialia, 110, 283–294. http://access.bl.uk/ark:/81055/vdc_100074778333.0x00001e