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APA Citation
Stange, H., Brunken, S., Greiner, D., Heinemann, M., Kaufmann, C. A., Schmidt, S. S., Bäcker, J., Klaus, M., Genzel, C., & Mainz, R. (2016). diffusion-induced grain boundary migration as mechanism for grain growth and defect annihilation in chalcopyrite thin films. Acta materialia, 111, 377–384. http://access.bl.uk/ark:/81055/vdc_100180563479.0x00001f