Cite
HARVARD Citation
Rai, M. et al. (2023). Low-Frequency Noise Characterization and Thermal Stability Analysis of Negative Capacitance Junction-Less Transistors. Integrated ferroelectrics. 232 (1), pp. 43-62. [Online].
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Rai, M. et al. (2023). Low-Frequency Noise Characterization and Thermal Stability Analysis of Negative Capacitance Junction-Less Transistors. Integrated ferroelectrics. 232 (1), pp. 43-62. [Online].