Low-Frequency Noise Characterization and Thermal Stability Analysis of Negative Capacitance Junction-Less Transistors. Issue 1 (12th February 2023)

• Record Type: Journal Article
• Authors: Rai, Manish Kumar; Rai, Sanjeev
• Is Part Of: Integrated ferroelectrics. Volume 232:Issue 1(2023)
• Page Start: 43
• Page End: 62
• Publication Date: 2023-02-12
• Subjects: Ferroelectric -- negative capacitance -- junction-less transistor -- low-frequency noise -- carrier number fluctuation; Ferroelectric devices -- Periodicals; Integrated circuits -- Periodicals; 537.244805
• DOI: 10.1080/10584587.2023.2173441
• Languages: English
• ISSNs: 1058-4587

Abstract

Abstract: This article presents the stability and noise analysis of the negative capacitance cylindrical gate junction-less transistor (NC-CyJLT). Application of the negative capacitance concept has fetched very good results, where a sufficient reduction in power dissipation and reduced subthreshold swing is achieved. Results indicate that NC-CyJLT devices have reduced flicker and thermal noise, show a significant (63.6%) reduction in low-frequency noise and a reduction of 92.1% in thermal noise. Further, it has been proved that NC-CyJLT is the least affected due to temperature, hence, stability improves with low-power dissipation which suggests that the device is suitable for biomedical and sensor applications.