Cite
HARVARD Citation
Vianne, B. et al. (2023). 28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling. Solid-state electronics. p. . [Online].
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Vianne, B. et al. (2023). 28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling. Solid-state electronics. p. . [Online].