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APA Citation
Parisini, A., Bosio, A., von Bardeleben, H. J., Jimenez, J., Dadgostar, S., Pavesi, M., Baraldi, A., Vantaggio, S., & Fornari, R. (2022). deep and shallow electronic states associated to doping, contamination and intrinsic defects in ε-Ga2O3 epilayers. Materials science in semiconductor processing, 138, . http://access.bl.uk/ark:/81055/vdc_100146365007.0x000024