Cite
HARVARD Citation
Simoen, E. et al. (2017). (Invited) Impact of the Metal Gate on the Oxide Stack Quality Assessed by Low-Frequency Noise. ECS transactions. pp. 69-80. [Online].
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Simoen, E. et al. (2017). (Invited) Impact of the Metal Gate on the Oxide Stack Quality Assessed by Low-Frequency Noise. ECS transactions. pp. 69-80. [Online].