Cite
MLA Citation
Yadira Arroyo Rojas Dasilva et al.. “Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM.” Acta materialia, vol. 167, 2019, pp. 159–166. http://access.bl.uk/ark:/81055/vdc_100083882002.0x000010