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HARVARD Citation
Arroyo Rojas Dasilva, Y. et al. (2019). Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM. Acta materialia. pp. 159-166. [Online].
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Arroyo Rojas Dasilva, Y. et al. (2019). Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM. Acta materialia. pp. 159-166. [Online].