Cite
APA Citation
Koelling, S., Plantenga, R. C., Hauge, H. I., Ren, Y., Li, A., Verheijen, M. A., Conesa Boj, S., Assali, S., Koenraad, P. M., & Bakkers, E. P. (2016). impurity and Defect Monitoring in Hexagonal Si and SiGe Nanocrystals. ECS transactions, 75, 751–760. http://access.bl.uk/ark:/81055/vdc_100117124710.0x00001d