Cite
APA Citation
Werner, S., Guttmann, P., Siewert, F., Sokolov, A., Mast, M., Huang, Q., Feng, Y., Li, T., Senf, F., Follath, R., Liao, Z., Kutukova, K., Zhang, J., Feng, X., Wang, Z., Zschech, E., & Schneider, G. (2023). spectromicroscopy of Nanoscale Materials in the Tender X‐Ray Regime Enabled by a High Efficient Multilayer‐Based Grating Monochromator. Small methods, 7(1), n/a. http://access.bl.uk/ark:/81055/vdc_100173985478.0x000005