A Fractional-N CP-PLL with fast two-point modulation calibration using duty-cycle and polarity tracking technique in 110-nm CMOS. (February 2023)
- Record Type:
- Journal Article
- Title:
- A Fractional-N CP-PLL with fast two-point modulation calibration using duty-cycle and polarity tracking technique in 110-nm CMOS. (February 2023)
- Main Title:
- A Fractional-N CP-PLL with fast two-point modulation calibration using duty-cycle and polarity tracking technique in 110-nm CMOS
- Authors:
- Jin, Zirui
Hu, Ang
Shan, Xiaoyu
Zhang, Chengcheng
Cui, Jinsong
Lei, Jianming
Liu, Dongsheng - Abstract:
- Abstract: This article proposes a fractional- N charge pump phase-locked loop ( C P-PLL) with fast two-point modulation calibration using Duty-Cycle and Polarity Tracking technique. The proposed calibration method can perform delay and gain calibration within 15 μs, respectively. A DTC-assisted Polarity Detector is used to track and countervail the propagation delay of two modulation paths. A TDC-based Duty-Cycle Detector is used to monitor and compensate the two paths gain mismatch. By comparing the code with the threshold set in the look-up table (LUT), a quick calibration can be achieved. To maintain high out-band phase noise performance and stronger robustness, a Class-C oscillator using Capacitance Desensitization technique and Cross-Bias technique is adopted in the design. The proposed C P-PLL is implemented in a standard 110-nm CMOS technology, occupying 2.7 mm 2 silicon area. The post-simulation results show the proposed calibration method can calibrate the delay/gain mismatch within 30 μs. Fast calibration mode supports calibration time within 62.5 ns. The phase noise performance is −91-dBc/Hz@100 kHz, −119-dBc/Hz@1 MHz. The entire C P-PLL dissipates 20.9-mW and achieves an RMS jitter of 6.2 ps, corresponding to a figure of merit (FOM) of −211-dB.
- Is Part Of:
- Microelectronics journal. Volume 132(2023)
- Journal:
- Microelectronics journal
- Issue:
- Volume 132(2023)
- Issue Display:
- Volume 132, Issue 2023 (2023)
- Year:
- 2023
- Volume:
- 132
- Issue:
- 2023
- Issue Sort Value:
- 2023-0132-2023-0000
- Page Start:
- Page End:
- Publication Date:
- 2023-02
- Subjects:
- —Capacitance desensitization -- Class-C oscillator -- Duty-cycle detector -- Fractional-N PLL -- Out-band phase noise -- Polarity detector -- Two-point modulation
Microelectronics -- Periodicals
Microélectronique -- Périodiques
Microelectronics
Electronic journals
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621.3805 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/5877621.html ↗
http://www.sciencedirect.com/science/journal/00262692 ↗
http://www.intute.ac.uk/sciences/cgi-bin/fullrecord.pl?handle=lesa.1012319367 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.mejo.2022.105676 ↗
- Languages:
- English
- ISSNs:
- 0959-8324
- Deposit Type:
- Legaldeposit
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